Wafer Sort

Cirtek Electronics Corporation extends its capability for Wafer Level Electrical Testing and Sorting.

Available wafer prober models such EG2001 and EG2080 can accommodate 6-inch wafers and 8-inch wafers with up to 4 mils wafer thickness.

All wafer probers are equipped with SE Probe Wafer Mapping and SMART Probe Technology for wafer sort requirements of either sampling only or 100% probing.

Options for separate and on-line inking is also available.

Services

Package Design & Development
Test Development
Wafer Sort
Final Test
Logistics & Warehousing